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Filtering by: Contributor Camesano, Terri Anne Contributor Garcia, Rafael Contributor Martin, Jack

1. From nanoscale to macroscale, using the atomic force microscope to quantify the role of few-asperity contacts in adhesion

Keyword:: Surface roughness; Surface forces; Van der Waals f
Creator:: Thoreson, Erik J.
Advisor:: Burnham, Nancy A.
Publisher:: Worcester Polytechnic Institute
Date Created:: 2006-01-09
Resource Type:: Dissertation
Degree:: PhD
Unit (Department):: Physics