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Filtern nach: Advisor Brown, Christopher A. Unit (Department) Manufacturing Engineering

1. Quantitative Multiscale Analysis of Topographical Anisotropy on Biological and Engineering Surfaces

Stichwort:: Roughness, Anisotropy, and Surface
Schöpfer:: Bergstrom, Torbjorn S.
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2019-07-11
Resource Type:: Dissertation
Degree:: PhD
Unit (Department):: Manufacturing Engineering

2. Functional Metrics in Axiomatic Design

Stichwort:: Design, Axiomatic Design, and Metrics
Schöpfer:: Henley, Richard
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2018-12-14
Resource Type:: Dissertation
Degree:: PhD
Unit (Department):: Manufacturing Engineering

3. The Design of Engineering Education as a Manufacturing System

Stichwort:: Education, value added, Axiomatic Design, and manufacturing
Schöpfer:: Towner, Jr., Walter T.
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2013-04-23
Resource Type:: Dissertation
Degree:: PhD
Unit (Department):: Manufacturing Engineering

4. Investigation into the influence of threshold forces and vibrations in diamond roll plunge dressing of grinding wheels

Stichwort:: Diamond Roll Dressing, Vibrations, Force Adaptive Grinding, Threshold Forces, Filtering, and Signal Processing
Schöpfer:: Geiger, Douglas J
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2005-04-26
Resource Type:: Thesis
Degree:: MS
Unit (Department):: Manufacturing Engineering

5. Process Models for Laser Engineered Net Shaping

Stichwort:: laser engineered net shaping, rapid prototyping, LENS, titanium, solid freeform fabrication, and laser
Schöpfer:: Kummailil, John
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2004-04-29
Resource Type:: Dissertation
Degree:: PhD
Unit (Department):: Manufacturing Engineering

6. Investigation of Measurement Artifacts Introduced By Horizontal Scanning Surface Profiling Instruments

Stichwort:: Scanning Instruments, Fractal, Anisotropy, Surface, Scanning, and Surface Metrology
Schöpfer:: Bergstrom, Torbjorn S
Advisor:: Brown, Christopher A.
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2002-01-08
Resource Type:: Thesis
Degree:: MS
Unit (Department):: Manufacturing Engineering