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Filtering by: Advisor Burnham, Nancy A. Contributor Garcia, Rafael Contributor Martin, Jack

From nanoscale to macroscale, using the atomic force microscope to quantify the role of few-asperity contacts in adhesion

Keyword:

Surface roughness; Surface forces; Van der Waals f

Creator:

Thoreson, Erik J.

Advisor:

Burnham, Nancy A.

Publisher:

Worcester Polytechnic Institute

Date Created:

2006-01-09

Resource Type:

Dissertation

Degree:

PhD

Unit (Department):

Physics