Index Catalog // Digital WPI

Start Over

Filtering by: Contributor Sullivan, John M. Keyword scanning white light

Development of a modular interferometric microscopy system for characterization of MEMS

Keyword:

Interferometry, shape and deformation measurement, Vibration, thermal, MEMS, vacuum, scanning white light, and vibrometry

Creator:

Klempner, Adam R.

Advisor:

Pryputniewicz, Ryszard J.

Publisher:

Worcester Polytechnic Institute

Date Created:

2007-01-04

Resource Type:

Thesis

Degree:

MS

Unit (Department):

Mechanical Engineering