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Thoreson, Erik J.
Remove constraint Creator: Thoreson, Erik J.
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From nanoscale to macroscale, using the atomic force microscope to quantify the role of few-asperity contacts in adhesion
Keyword:
Surface roughness; Surface forces; Van der Waals f
Creator:
Thoreson, Erik J.
Advisor:
Burnham, Nancy A.
Publisher:
Worcester Polytechnic Institute
Date Created:
2006-01-09
Resource Type:
Dissertation
Degree:
PhD
Unit (Department):
Physics
Apparatus to Deliver Light to the Tip-sample Interface of an Atomic Force Microscope (AFM)
Keyword:
photoactive
,
photoinduced
,
molecular conformation
,
atomic force microscope
,
AFM
,
photoreactive
,
photoinduced conformation change
,
tip-sample interface
,
photocycle
,
purple membrane
,
bacteriorhodopsin
,
photomechanics
,
PLDS
, and
bimetallic bending
Creator:
Thoreson, Erik J.
Advisor:
Burnham, Nancy A.
Publisher:
Worcester Polytechnic Institute
Date Created:
2002-10-03
Resource Type:
Thesis
Degree:
MS
Unit (Department):
Physics
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Creator
Thoreson, Erik J.
[remove]
2
Advisor
Burnham, Nancy A.
2
Contributor
Burnham, Nancy A.
2
Camesano, Terri Anne
1
DePaor, Declan G.
1
Garcia, Rafael
1
Martin, Jack
1
Unit (Department)
Physics
2
Publisher
Worcester Polytechnic Institute
2
Resource type
Dissertation
1
Thesis
1