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Filtragem por: O Criador Thoreson, Erik J.

From nanoscale to macroscale, using the atomic force microscope to quantify the role of few-asperity contacts in adhesion

Palavra-chave:

Surface roughness; Surface forces; Van der Waals f

O Criador:

Thoreson, Erik J.

Advisor:

Burnham, Nancy A.

Editor:

Worcester Polytechnic Institute

Data Criada:

2006-01-09

Resource Type:

Dissertation

Degree:

PhD

Unit (Department):

Physics
Apparatus to Deliver Light to the Tip-sample Interface of an Atomic Force Microscope (AFM)

Palavra-chave:

photoactive, photoinduced, molecular conformation, atomic force microscope, AFM, photoreactive, photoinduced conformation change, tip-sample interface, photocycle, purple membrane, bacteriorhodopsin, photomechanics, PLDS, and bimetallic bending

O Criador:

Thoreson, Erik J.

Advisor:

Burnham, Nancy A.

Editor:

Worcester Polytechnic Institute

Data Criada:

2002-10-03

Resource Type:

Thesis

Degree:

MS

Unit (Department):

Physics