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analysis
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Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
Keyword:
analysis
,
Calibration
,
curve fitting
,
Atomic Force Microscopy
,
friction
,
force curves
, and
lateral force microscopy
Creator:
Anderson, Evan V
Advisor:
Burnham, Nancy A.
and
Camesano, Terri Anne
Publisher:
Worcester Polytechnic Institute
Date Created:
2012-04-26
Resource Type:
Thesis
Degree:
MS
Unit (Department):
Physics
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Masters Theses
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2012
1
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Anderson, Evan V
1
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Burnham, Nancy A.
1
Camesano, Terri Anne
1
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Burnham, Nancy A.
1
Camesano, Terri Anne
1
Tao, Mingjiang
1
Wen, Qi
1
Unit (Department)
Physics
[remove]
1
Publisher
Worcester Polytechnic Institute
1
Resource type
Thesis
1
