Index Catalog // Hyrax

Cancellare i filtri

Filtro per: Parola chiave Scanning Instruments

Investigation of Measurement Artifacts Introduced By Horizontal Scanning Surface Profiling Instruments

Parola chiave:

Scanning Instruments, Fractal, Anisotropy, Surface, Scanning, and Surface Metrology

Creatore:

Bergstrom, Torbjorn S

Advisor:

Brown, Christopher A.

Editore:

Worcester Polytechnic Institute

data di creazione:

2002-01-08

Resource Type:

Thesis

Degree:

MS

Unit (Department):

Manufacturing Engineering