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Surface roughness; Surface forces; Van der Waals f
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From nanoscale to macroscale, using the atomic force microscope to quantify the role of few-asperity contacts in adhesion
Keyword:
Surface roughness; Surface forces; Van der Waals f
Creator:
Thoreson, Erik J.
Advisor:
Burnham, Nancy A.
Publisher:
Worcester Polytechnic Institute
Date Created:
2006-01-09
Resource Type:
Dissertation
Degree:
PhD
Unit (Department):
Physics
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PhD Dissertations
1
Year
2006
1
Creator
Thoreson, Erik J.
1
Advisor
Burnham, Nancy A.
1
Contributor
Burnham, Nancy A.
1
Camesano, Terri Anne
1
DePaor, Declan G.
1
Garcia, Rafael
1
Martin, Jack
1
Unit (Department)
Physics
1
Publisher
Worcester Polytechnic Institute
1
Resource type
Dissertation
1
