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Filtrado por: Palabra clave Surface roughness; Surface forces; Van der Waals f

1. From nanoscale to macroscale, using the atomic force microscope to quantify the role of few-asperity contacts in adhesion

Palabra clave:: Surface roughness; Surface forces; Van der Waals f
Creador:: Thoreson, Erik J.
Advisor:: Burnham, Nancy A.
Editor:: Worcester Polytechnic Institute
Fecha de Creacion:: 2006-01-09
Resource Type:: Dissertation
Degree:: PhD
Unit (Department):: Physics