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Filtragem por: Palavra-chave Surface roughness; Surface forces; Van der Waals f

From nanoscale to macroscale, using the atomic force microscope to quantify the role of few-asperity contacts in adhesion

Palavra-chave:

Surface roughness; Surface forces; Van der Waals f

O Criador:

Thoreson, Erik J.

Advisor:

Burnham, Nancy A.

Editor:

Worcester Polytechnic Institute

Data Criada:

2006-01-09

Resource Type:

Dissertation

Degree:

PhD

Unit (Department):

Physics