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1. Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis

Keyword:: analysis, Calibration, curve fitting, Atomic Force Microscopy, friction, force curves, and lateral force microscopy
Creator:: Anderson, Evan V
Advisor:: Burnham, Nancy A. and Camesano, Terri Anne
Publisher:: Worcester Polytechnic Institute
Date Created:: 2012-04-26
Resource Type:: Thesis
Degree:: MS
Unit (Department):: Physics