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Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis

Palavra-chave:

analysis, Calibration, curve fitting, Atomic Force Microscopy, friction, force curves, and lateral force microscopy

O Criador:

Anderson, Evan V

Advisor:

Burnham, Nancy A. and Camesano, Terri Anne

Editor:

Worcester Polytechnic Institute

Data Criada:

2012-04-26

Resource Type:

Thesis

Degree:

MS

Unit (Department):

Physics