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1. VCO-Based ADC With Digital Background Calibration in 65nm CMOS

Schöpfer:: Gong, Jianping, Li, Sulin, and McNeill, John A.
Herausgeber:: IEEE
Resource Type:: Conference Proceeding

2. Fundamental limits on energy efficiency performance of VCO-based ADCs

Schöpfer:: Pham, Long, Gong, Jianping, Li, Sulin, and McNeill, John
Herausgeber:: IEEE
Resource Type:: Conference Proceeding

3. Sub-picosecond-jitter clock generation for interleaved ADC with Delay-Locked-Loop in 28nm CMOS

Schöpfer:: Li, Sulin, Gong, Jianping, and McNeill, John A.
Herausgeber:: IEEE
Resource Type:: Conference Proceeding

4. On The Metrology of Surfaces Produced by Laser Melting Of Powders

Stichwort:: Surface metrology
Schöpfer:: Velez, Joseluis A., Brown, Christopher A. , Mancini, Matthew P., and Lemoine, Adam C.
Herausgeber:: American Society for Precision Engineering
Datum erstellt:: 2016
Resource Type:: Conference Proceeding

5. Peer Review Guide for Project-Based Team Writing

Stichwort:: Project-Based Learning, Peer Review, Peer Editing, Peer Feedback, Revision Guide, and Team Writing
Schöpfer:: Davis, John-Michael
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2023
Resource Type:: Article

6. Longitudinal evaluation of a university-based outreach program for middle school girls yields evidence of positive engineering recruitment outcomes

Stichwort:: girls in engineering, gender equity in STEM , K-12 outreach programs, intersectionality, college recruitment, and informal science
Schöpfer:: Sontgerath, Suzanne and Demetry, Chrysanthe
Resource Type:: Article

7. Grinding Wheel Texture and Diamond Roll Plunge Dressing Feed-Rates

Stichwort:: Dressing, Grinding, and Topography
Schöpfer:: Powers, B., Geiger, D.J., St. Gelais, R.M., Brown, C.A., Bergstrom, T.S., and Hahn, R.S.
Herausgeber:: Society of Manufacturing Engineers
Datum erstellt:: 2007
Resource Type:: Conference Proceeding

8. Comparison of surface texture measurement systems

Stichwort:: Surface metrology, Texture, Roughness, Uncertainty, Height difference maps, Multiscale geometric analyses, Area-scale, and Sequential topographic measurements
Schöpfer:: Brown, Christopher A., Kummailil, John, Bergstrom, Torbjorn S., Hamel, Rebecca A., and Gray, Amy R.
Herausgeber:: Shaker Verlag
Datum erstellt:: 2004
Resource Type:: Conference Proceeding

9. Uncertainty and Quality in the Measurement and Characterization of the Texture of Abrasive Media

Stichwort:: Surface Metrology, Replica, Roughness, and Grinding
Schöpfer:: Brown, C. A., Powers, B. M., and Bergstrom, T. S.
Herausgeber:: Society of Manufacturing Engineers
Datum erstellt:: 2008
Resource Type:: Conference Proceeding

10. Data for "Thermodynamic feasibility of shipboard conversion of marine plastics to blue diesel for self-powered ocean cleanup"

Stichwort:: sensitivity analysis and Monte Carlo simulation
Schöpfer:: Kazantzis, Nikolaos K., Kite-Powell, Hauke, Herschbach, Dudley R., Reddy, Christopher M., Timko, Michael T., Belden, Elizabeth R., and Italiani, Eduardo
Herausgeber:: Worcester Polytechnic Institute
Datum erstellt:: 2021-10
Resource Type:: Dataset

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