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Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis Public

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This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.

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  • 01/29/2021
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  • English
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  • etd-042612-131725
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  • 2012
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  • 2012-04-26
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Permanent link to this page: https://digital.wpi.edu/show/cz30ps77f