This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.

Creator

• Anderson, Evan V

Contributeurs

• Wen, Qi
• Burnham, Nancy A.
• Tao, Mingjiang
• Camesano, Terri Anne

Degree

• MS

Unit

• Physics

Publisher

• Worcester Polytechnic Institute

Language

• English

Identifier

• etd-042612-131725

Mot-clé

• analysis
• Calibration
• curve fitting
• Atomic Force Microscopy
• friction
• force curves
• lateral force microscopy

Advisor

• Burnham, Nancy A.
• Camesano, Terri Anne

Committee

• Wen, Qi
• Tao, Mingjiang

Defense date

• 2012-04-25

Year

• 2012

Date created

• 2012-04-26

Resource type

• Thesis

Rights statement

• In Copyright

Dernière modification

• 2021-01-29