This research explores the ability to force fault diversification in redundant modules through core layout with respect to electromagnetic fault injection (EMFI). Fault diversification improves on current redundancy schemes by causing variation in corrupt outputs from redundant modules. To investigate fault diversification, we ran behavior simulations and conducted physical EMFI lab testing for various soft-core processor layouts on an FPGA. During lab testing, we discovered identical corrupt outputs between different core layouts. However, placing submodules of redundant elements in separate clock regions significantly reduced the occurrences of corrupt outputs, and thereby, decreased the probability of identical corrupt outputs across different core layouts.

• This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.

Creator

• Kohlhoff, Alec
• Scaplen, Kyle Robert

Publisher

• Worcester Polytechnic Institute

Identifier

• E-project-121318-110446

Advisor

• Walls, Robert Joseph
• Clark, Andrew

Year

• 2018

Center

• MITRE-Bedford, Massachusetts Project Center - MQP

Sponsor

• MITRE Corporation

Date created

• 2018-12-13

Resource type

• Major Qualifying Project

Major

• Computer Science
• Electrical & Computer Engineering

Rights statement

• In Copyright