Methods to study the mechanical response of carbon nanotubes with atomic force microscopy

Thompson, Nathan Paul

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Methods to study the mechanical response of carbon nanotubes with atomic force microscopy

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Using a 2.7 kHz laterally vibrating straight silicon AFM tip (manufactures force constant .03 N/m) in contact mode, images were produced that correspond to the LFM amplitude of the tip while scanning over the surface of MWNT on a HOPG substrate. On the surface of the MWNT the LFM amplitude was 1 volt lower than when on HOPG, characterizing a shearing behavior. The caps of the nanotube show a stiffer response than the tubular portions of the MWNT.

This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.

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