Using a 2.7 kHz laterally vibrating straight silicon AFM tip (manufactures force constant .03 N/m) in contact mode, images were produced that correspond to the LFM amplitude of the tip while scanning over the surface of MWNT on a HOPG substrate. On the surface of the MWNT the LFM amplitude was 1 volt lower than when on HOPG, characterizing a shearing behavior. The caps of the nanotube show a stiffer response than the tubular portions of the MWNT.

• This report represents the work of one or more WPI undergraduate students submitted to the faculty as evidence of completion of a degree requirement. WPI routinely publishes these reports on its website without editorial or peer review.

Creator

• Thompson, Nathan Paul

Publisher

• Worcester Polytechnic Institute

Identifier

• 02D508M

Advisor

• Burnham, Nancy A.

Year

• 2002

Date created

• 2002-01-01

Resource type

• Major Qualifying Project

Major

• Physics

Rights statement

• In Copyright