Lateral Force Calibration for Probe MicroscopyPublic
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To improve the measurement of nanoscale friction, a new alternate method of lateral calibration for the atomic force microscope was examined. This method, which offers the advantage of reduced tip wear, was reviewed and analyzed, and fundamental flaws were identified in its derivation. After modifying this approach, we attempted to confirm our corrected model with a commonly accepted calibration method. The collected data displayed as yet unexplained oscillatory behavior, which showed strong correlations between lateral, drive, and error signals.
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