Index Catalog // Digital WPI

Start Over

Filtering by: Contributor Wen, Qi Keyword lateral force microscopy

Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis

Keyword:

analysis, Calibration, curve fitting, Atomic Force Microscopy, friction, force curves, and lateral force microscopy

Creator:

Anderson, Evan V

Advisor:

Burnham, Nancy A. and Camesano, Terri Anne

Publisher:

Worcester Polytechnic Institute

Date Created:

2012-04-26

Resource Type:

Thesis

Degree:

MS

Unit (Department):

Physics